Crystallographic mapping of ferroelectric thin films using piezoresponse force microscopy and electron backscatter diffraction
نویسندگان
چکیده
منابع مشابه
Ferroelectric Domain Imaging Multiferroic Films Using Piezoresponse Force Microscopy
Recently, multiferroic materials with the magnetoelectric coupling of ferroelectric (or anti‐ ferroelectric) properties and ferromagnetic (or antiferromagnetic) properties have attracted a lot of attention.[1-4] Among them, BiFeO3(BFO) and YMnO3has been intensively studied. For such ABO3perovskite structured ferroelectric materials, they usually show antiferromag‐ netic order because the same B...
متن کاملMisorientations in †001‡ magnetite thin films studied by electron backscatter diffraction and magnetic force microscopy
Magnetite thin films grown on 001 oriented MgO substrates are analyzed by means of electron backscatter diffraction EBSD analysis and magnetic force microscopy in applied fields. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high spatial resolution up to 20 nm on such ceramic samples. A high image quality of the recorded Kikuchi pattern...
متن کاملCrystallographic preferred orientations analysis of quartz crystals in Psammite using electron backscatter diffraction,western Ireland
The present study investigates the crystal preferred orientation (CPO) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (EBSD) on quartz crystals from north of the Renvyle-Bofin Slide (RBS) nearLetterfrack in western Ireland. Complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...
متن کاملThe measurement of ferroelectric thin films using piezo force microscopy
The use of Atomic Force Microscopy to evaluate the properties of ferroelectric thin films is often associated with poor contrast images and quantitative analysis is often not possible. In this paper elements of the metrology associated with this technique are explored, and results comparing different materials types and surface cleanliness are described.
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2008
ISSN: 1742-6596
DOI: 10.1088/1742-6596/126/1/012011